STEADY-STATE PHOTOCARRIER GRATING TECHNIQUE FOR DIFFUSION LENGTH MEASUREMENT IN PHOTOCONDUCTIVE INSULATORS

被引：155

作者：

RITTER, D ^{[1
]}

ZELDOV, E ^{[1
]}

WEISER, K ^{[1
]}

机构：

[1] TECHNION ISRAEL INST TECHNOL,DEPT ELECT ENGN,IL-32000 HAIFA,ISRAEL

来源：

APPLIED PHYSICS LETTERS | 1986年 / 49卷 / 13期

关键词：

D O I：

10.1063/1.97548

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

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页码：791 / 793

页数：3

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