DIFFERENTIAL SURFACE PHOTOVOLTAGE MEASUREMENT OF MINORITY-CARRIER DIFFUSION LENGTH IN THIN-FILMS

被引：18

作者：

SCHWARZ, R

SLOBODIN, D

WAGNER, S

机构：

来源：

APPLIED PHYSICS LETTERS | 1985年 / 47卷 / 07期

关键词：

D O I：

10.1063/1.96023

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：740 / 742

页数：3

共 9 条

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[7] COLLECTION LENGTH OF HOLES IN A-SI-H BY SURFACE PHOTO-VOLTAGE USING A LIQUID SCHOTTKY-BARRIER [J].

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[8] INTENSITY DEPENDENCE OF DIFFUSION LENGTH IN AMORPHOUS-SILICON BY SURFACE PHOTOVOLTAGE MEASUREMENTS [J].

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