Ultrahigh vacuum instrument that combines variable-temperature scanning tunneling microscopy with Fourier transform infrared reflection-absorption spectroscopy for studies of chemical reactions at surfaces

被引：11

作者：

Beck, D ^{[1
]}

Batzill, M ^{[1
]}

Baur, C ^{[1
]}

Kim, J ^{[1
]}

Koel, BE ^{[1
]}

机构：

[1] Univ So Calif, Los Angeles, CA 90089 USA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2002年 / 73卷 / 03期

关键词：

D O I：

10.1063/1.1445863

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We describe the construction of an ultrahigh vacuum chamber that incorporates variable-temperature scanning tunneling microscopy (STM), Fourier transform infrared reflection-absorption spectroscopy (FT-IRAS), Auger electron spectroscopy, low-energy electron diffraction, and temperature programmed desorption, for studying structure and reactivity at surfaces. The chamber and manipulator design enables in situ sample preparation and analysis, and rapid access to several surface-analytical techniques by rotation only. This eliminates sample inconsistencies due to ex situ preparation or the necessity to run parallel experiments. Inclusion of FT-IRAS allows us to characterize surface species and identify adsorbates during studies using STM. (C) 2002 American Institute of Physics.

引用

页码：1267 / 1272

页数：6

共 35 条

[1] RELIABLE TIP PREPARATION FOR HIGH-RESOLUTION SCANNING-TUNNELING-MICROSCOPY
ALBREKTSEN, O
SALEMINK, HWM
MORCH, KA
THOLEN, AR
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1994, 12 (06): : 3187 - 3190
[2] Electronic contrast in scanning tunneling microscopy of Sn-Pt(111) surface alloys
Batzill, M
Reck, DE
Koel, BE
[J]. SURFACE SCIENCE, 2000, 466 (1-3) : L821 - L826
[3] Structure of monolayer tin oxide films on Pt(111) formed using NO2 as an efficient oxidant -: art. no. 245402
Batzill, M
Beck, DE
Koel, BE
[J]. PHYSICAL REVIEW B, 2001, 64 (24)
[4] Self-organized molecular-sized, hexagonally ordered SnOx nanodot superlattices on Pt(111)
Batzill, M
Beck, DE
Koel, BE
[J]. APPLIED PHYSICS LETTERS, 2001, 78 (18) : 2766 - 2768
[5] BATZILL M, IN PRESS J VAC SCI T
[6] BECK DR, UNPUB
[7] SIMPLE ION MILLING PREPARATION OF (111)TUNGSTEN TIPS
BIEGELSEN, DK
PONCE, FA
TRAMONTANA, JC
[J]. APPLIED PHYSICS LETTERS, 1989, 54 (13) : 1223 - 1225
[8] ION MILLED TIPS FOR SCANNING TUNNELING MICROSCOPY
BIEGELSEN, DK
PONCE, FA
TRAMONTANA, JC
KOCH, SM
[J]. APPLIED PHYSICS LETTERS, 1987, 50 (11) : 696 - 698
[9] CHARACTERIZATION OF MICROTIPS FOR SCANNING TUNNELING MICROSCOPY
BINH, VT
MARIEN, J
[J]. SURFACE SCIENCE, 1988, 202 (1-2) : L539 - L549
[10] INSITU FABRICATION AND REGENERATION OF MICROTIPS FOR SCANNING TUNNELLING MICROSCOPY
BINH, VT
[J]. JOURNAL OF MICROSCOPY-OXFORD, 1988, 152 : 355 - 361

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