ION MILLED TIPS FOR SCANNING TUNNELING MICROSCOPY

被引：78

作者：

BIEGELSEN, DK ^{[1
]}

PONCE, FA ^{[1
]}

TRAMONTANA, JC ^{[1
]}

KOCH, SM ^{[1
]}

机构：

[1] STANFORD UNIV,STANFORD,CA 94305

来源：

APPLIED PHYSICS LETTERS | 1987年 / 50卷 / 11期

关键词：

D O I：

10.1063/1.98070

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：696 / 698

页数：3

共 12 条

[1]

BARRETT CS, 1966, STRUCTURE METALS, P545

[2] SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY [J].

BINNING, G ;

ROHRER, H ;

GERBER, C ;

WEIBEL, E .

PHYSICAL REVIEW LETTERS, 1982, 49 (01) :57-61

[3]

DIETRICH HP, 1984, IBM TECH DISC B, V27, P3039

[4] MONO-ATOMIC TIPS FOR SCANNING TUNNELING MICROSCOPY [J].

FINK, HW .

IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1986, 30 (05) :460-465

[5] HIGH-RESOLUTION STRUCTURING OF EMITTER TIPS FOR THE GASEOUS FIELD-IONIZATION SOURCE [J].

KUBBY, JA ;

SIEGEL, BM .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1986, 4 (01) :120-125

[6] ROLE OF TIP STRUCTURE IN SCANNING TUNNELING MICROSCOPY [J].

KUK, Y ;

SILVERMAN, PJ .

APPLIED PHYSICS LETTERS, 1986, 48 (23) :1597-1599

[7]

1985, 201323 INT CTR DIFFR

[8]

1985, 500387 INT CTR DIFFR

[9]

1985, 50386 INT CTR DIFFR

[10]

1985, 50392 INT CTR DIFFR

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