Experimental evidence of multiple stable locations for a domain wall trapped by a submicron notch

被引：35

作者：

Lacour, D ^{[1
]}

Katine, JA ^{[1
]}

Folks, L ^{[1
]}

Block, T ^{[1
]}

Childress, JR ^{[1
]}

Carey, MJ ^{[1
]}

Gurney, BA ^{[1
]}

机构：

[1] Hitachi San Jose Res Ctr, San Jose, CA 95120 USA

来源：

APPLIED PHYSICS LETTERS | 2004年 / 84卷 / 11期

关键词：

D O I：

10.1063/1.1686893

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The presence of a domain wall trapped by a submicron notch is probed in two ways: through electronic transport measurements and by magnetic force microscopy (MFM). MFM data, exhibiting complex magnetic features, are consistent with numerical simulations predicting the existence of multiple magnetic configurations stabilized at the notch. By changing the MFM scanning history we demonstrate experimentally the existence of multiple stable locations for a domain wall trapped by a submicron notch. (C) 2004 American Institute of Physics.

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收藏

页码：1910 / 1912

页数：3

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