Controlled vertical manipulation of single CO molecules with the scanning tunneling microscope: A route to chemical contrast

被引:330
作者
Bartels, L
Meyer, G
Rieder, KH
机构
[1] FU Berlin, FB Physik, 14195 Berlin
关键词
D O I
10.1063/1.119503
中图分类号
O59 [应用物理学];
学科分类号
摘要
A reliable procedure for controlled vertical transfer of single CO molecules between a Cu(111) surface and a scanning tunneling microscope tip and vice versa is demonstrated. It is shown that with a tip having a single CO molecule at its apex, chemical contrast is achieved allowing distinction of adsorbed CO molecules and oxgen atoms, which look very similar to the bare metal tip. (C) 1997 American Institute of Physics.
引用
收藏
页码:213 / 215
页数:3
相关论文
共 20 条
[1]  
BINNIG G, 1982, PHYS REV LETT, V49, P52
[2]   STM and chemistry: A qualitative molecular orbital understanding of the image of CO oil a Pt surface [J].
Bocquet, ML ;
Sautet, P .
SURFACE SCIENCE, 1996, 360 (1-3) :128-136
[3]   IMAGING STANDING WAVES IN A 2-DIMENSIONAL ELECTRON-GAS [J].
CROMMIE, MF ;
LUTZ, CP ;
EIGLER, DM .
NATURE, 1993, 363 (6429) :524-527
[4]   AN ATOMIC SWITCH REALIZED WITH THE SCANNING TUNNELING MICROSCOPE [J].
EIGLER, DM ;
LUTZ, CP ;
RUDGE, WE .
NATURE, 1991, 352 (6336) :600-603
[5]   SCANNING TUNNELING SPECTROSCOPY [J].
FEENSTRA, RM .
SURFACE SCIENCE, 1994, 299 (1-3) :965-979
[6]   DIRECT OBSERVATION OF STANDING-WAVE FORMATION AT SURFACE STEPS USING SCANNING TUNNELING SPECTROSCOPY [J].
HASEGAWA, Y ;
AVOURIS, P .
PHYSICAL REVIEW LETTERS, 1993, 71 (07) :1071-1074
[7]   DEPOSITION AND SUBSEQUENT REMOVAL OF SINGLE SI ATOMS ON THE SI(111)-7X7 SURFACE BY A SCANNING TUNNELING MICROSCOPE [J].
HUANG, DH ;
UCHIDA, H ;
AONO, M .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1994, 12 (04) :2429-2433
[8]  
ISHI S, 1990, CHEM PHYSICS SOLID S, V3, P289
[9]   Threefold electron scattering on graphite observed with C-60-adsorbed STM tips [J].
Kelly, KF ;
Sarkar, D ;
Hale, GD ;
Oldenburg, SJ ;
Halas, NJ .
SCIENCE, 1996, 273 (5280) :1371-1373
[10]   FIELD-INDUCED NANOMETER-SCALE TO ATOMIC-SCALE MANIPULATION OF SILICON SURFACES WITH THE STM [J].
LYO, IW ;
AVOURIS, P .
SCIENCE, 1991, 253 (5016) :173-176