A Direct Evidence of Morphological Degradation on a Nanometer Scale in Polymer Solar Cells

被引：178

作者：

Schaffer, Christoph J. ^{[1
]}

Palumbiny, Claudia M. ^{[1
]}

Niedermeier, Martin A. ^{[1
]}

Jendrzejewski, Christian ^{[1
]}

Santoro, Gonzalo ^{[2
]}

Roth, Stephan V. ^{[2
]}

Mueller-Buschbaum, Peter ^{[1
]}

机构：

[1] Tech Univ Munich, Dept Phys, Lehrstuhl Funkt Mat, D-85748 Garching, Germany

[2] Deutsch Elektronen Synchrotron DESY, D-22607 Hamburg, Germany

来源：

ADVANCED MATERIALS | 2013年 / 25卷 / 46期

关键词：

organic photovoltaics; degradation; morphology; bulk heterojunction; in situ grazing incidence small angle X-ray scattering (GISAXS); LIGHT-EMITTING-DIODES; BULK HETEROJUNCTION POLYMER; LOW-BANDGAP POLYMER; X-RAY-SCATTERING; BLACK SPOTS; EFFICIENCY; FILMS; MECHANISMS; STABILITY;

D O I：

10.1002/adma.201302854

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

In situ measurement of a polymer solar cell using micro grazing incidence small angle X-ray scattering (μGISAXS) and current-voltage tracking is demonstrated. While measuring electric characteristics under illumination, morphological changes are probed by μGISAXS. The X-ray beam (green) impinges on the photo active layer with a shallow angle and scatters on a 2d detector. Degradation is explained by the ongoing nanomorphological changes observed. © 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

引用

页码：6760 / 6764

页数：5

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