Correlated topographic and spectroscopic imaging by combined atomic force microscopy and optical microscopy

被引：14

作者：

Hu, DH ^{[1
]}

Micic, M ^{[1
]}

Klymyshyn, N ^{[1
]}

Suh, YD ^{[1
]}

Lu, HP ^{[1
]}

机构：

[1] Pacific NW Natl Lab, Fundamental Sci Div, Richland, WA 99352 USA

来源：

JOURNAL OF LUMINESCENCE | 2004年 / 107卷 / 1-4期

关键词：

atomic force microscopy; fluorescence lifetime imaging;

D O I：

10.1016/j.jlumin.2003.12.045

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Near-field scanning microscopy is a powerful approach to obtain topographic and spectroscopic characterization simultaneously for imaging biological and nanoscale systems. To achieve optical imaging at high spatial resolution beyond the diffraction limit, aperture-less metallic scanning tips have been utilized to enhance the laser illumination local electromagnetic field at the apex of the scanning tips. In this paper, we discuss and review our work on combined fluorescence imaging with AFM-metallic tip enhancement, finite element method simulation of the tip enhancement, and their applications on AFM-tip enhanced fluorescence lifetime imaging (AFM-FLIM) and correlated AFM and FLIM imaging of the living cells. (C) 2004 Elsevier B.V. All rights reserved.

引用

页码：4 / 12

页数：9

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