Two-dimensional index profiling of fibers and waveguides

被引:22
作者
Fontaine, NH
Young, M
机构
[1] PK Technol, Beaverton, OR 97005 USA
[2] Colorado Sch Mines, Dept Phys, Golden, CO 80401 USA
关键词
D O I
10.1364/AO.38.006836
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We have constructed a two-dimensional refracted-ray scanner that can resolve index-of-refraction increments of approximately 4 x 10(-5). This resolution is an order of magnitude finer than the uncertainty of the measurement. The scanner can be adapted to evaluate either fibers or planar waveguides. The two-dimensional scan and the high precision allow visualization of features, such as deposition layers, that are difficult if not impossible to see in conventional one-dimensional scans. OCIS codes: 060.0060, 130.0130, 060.2300, 060.2430.
引用
收藏
页码:6836 / 6844
页数:9
相关论文
共 11 条
[1]  
Delly JG, 1988, Photography through the microscope
[2]   MATERIAL AND MODE DISPERSION IN GEO2.B2O3.SIO2 GLASSES [J].
FLEMING, JW .
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1976, 59 (11-1) :503-507
[3]  
FUNK DS, 1909, OPT FIB C
[4]   ALTERNATIVE CONFIGURATION FOR REFRACTED NEAR-FIELD MEASUREMENTS OF REFRACTIVE-INDEX ON GLASS-INTEGRATED-OPTICS WAVE-GUIDES [J].
GISIN, N ;
PELLAUX, JP ;
STAMP, P ;
HORI, N ;
MASUYAMA, M .
APPLIED OPTICS, 1992, 31 (33) :7108-7112
[5]  
Goring R., 1986, Journal of Optical Communications, V7, P82, DOI 10.1515/JOC.1986.7.3.82
[6]   REFRACTIVE-INDEX PROFILING - STATE OF THE ART [J].
RAINE, KW ;
BAINES, JGN ;
PUTLAND, DE .
JOURNAL OF LIGHTWAVE TECHNOLOGY, 1989, 7 (08) :1162-1169
[7]  
*RP CARG LAB, SPEC OPT LIQ
[8]  
VEASEY DL, IN PRESS J NONCRYST
[9]   PRACTICAL APPLICATION OF THE REFRACTED NEAR-FIELD TECHNIQUE FOR THE MEASUREMENT OF OPTICAL FIBER REFRACTIVE-INDEX PROFILES [J].
WHITE, KI .
OPTICAL AND QUANTUM ELECTRONICS, 1979, 11 (02) :185-196
[10]   OPTICAL FIBER INDEX PROFILES BY THE REFRACTED-RAY METHOD (REFRACTED NEAR-FIELD SCANNING) [J].
YOUNG, M .
APPLIED OPTICS, 1981, 20 (19) :3415-3422