Two-dimensional index profiling of fibers and waveguides

被引:22
作者
Fontaine, NH
Young, M
机构
[1] PK Technol, Beaverton, OR 97005 USA
[2] Colorado Sch Mines, Dept Phys, Golden, CO 80401 USA
关键词
D O I
10.1364/AO.38.006836
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We have constructed a two-dimensional refracted-ray scanner that can resolve index-of-refraction increments of approximately 4 x 10(-5). This resolution is an order of magnitude finer than the uncertainty of the measurement. The scanner can be adapted to evaluate either fibers or planar waveguides. The two-dimensional scan and the high precision allow visualization of features, such as deposition layers, that are difficult if not impossible to see in conventional one-dimensional scans. OCIS codes: 060.0060, 130.0130, 060.2300, 060.2430.
引用
收藏
页码:6836 / 6844
页数:9
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