Analysis of extending the field-of-view of reverse-microscope imaging system at millimeter-wavelengths

被引:11
作者
Dou, WB [1 ]
Deng, XD
Pan, JH
机构
[1] Southeast Univ, State Key Lab Millimeter Waves, Nanjing 210096, Peoples R China
[2] Acad Sci China, Nanjing Astron Instruments Ctr, Nanjing, Peoples R China
关键词
D O I
10.1163/156939304774113070
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper, focal field of reverse-microscope imaging system at millimeter wavelengths is analyzed with ray-tracing method and Stratton-Chu vector diffraction integral formula. Calculations have been compared with experiments and agreement is found. Lens profile is optimized to reduce aberrations and extend field-of-view of the imaging system. The numerical results are presented to show the field distribution of the optimized imaging system.
引用
收藏
页码:469 / 479
页数:11
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