Comparison of epitaxial growth of PbZr0.53Ti0.47O3 on SrRuO3 and La0.5Sr0.5CoO3

被引：23

作者：

Cho, JH ^{[1
]}

Park, KC

机构：

[1] Pusan Natl Univ, RCDAMP, Pusan 609735, South Korea

[2] Pusan Natl Univ, Dept Phys, Pusan 609735, South Korea

来源：

APPLIED PHYSICS LETTERS | 1999年 / 75卷 / 04期

关键词：

D O I：

10.1063/1.124418

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We report structural and ferroelectric properties of epitaxial PbZr0.53Ti0.47O3 thin films on SrRuO3 and La0.5Sr0.5CoO3 grown on (100) LaAlO3 single crystal substrates, where all the films were deposited by the pulsed-laser deposition method. While the PbZr0.53Ti0.47O3 film on La0.5Sr0.5CoO3/LaAlO3 shows (00l)-oriented heteroepitaxial growth with a rhombohedral structure, the PbZr0.53Ti0.47O3 film on SrRuO3/LaAlO3 shows a tetragonal mixture of (00l) and (h00) heteroepitaxial growth and the (00l)-oriented rhombohedral heteroepitaxial growth. The mixture of the rhombohedral and the tetragonal structures of the PbZr0.53Ti0.47O3 film on SrRuO3/LaAlO3 influences the ferroelectric properties by domain pinning. (C) 1999 American Institute of Physics. [S0003-6951(99)01530-2].

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页码：549 / 551

页数：3

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