Investigation of capillary forces using atomic force microscopy

被引:55
作者
Malotky, DL
Chaudhury, MK [1 ]
机构
[1] Lehigh Univ, Dept Chem Engn, Bethlehem, PA 18015 USA
[2] Lehigh Univ, Polymer Interface Ctr, Bethlehem, PA 18015 USA
关键词
D O I
10.1021/la0107796
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
An atomic force microscope tip, coated with a small amount of liquid silicone, was used to investigate the wetting and capillary bridging forces on various low- and high-energy surfaces. The low-energy surfaces were prepared by reacting alkyl and perfluoroalkyl functional silanes with a silicon wafer (Si/SiO2). Force-distance scans in air revealed that the silicone fluid forms ductile capillary bridges on the low-energy methyl and perfluoromethyl surfaces, whereas a tight bridge is formed on silica. Further studies on a silicon wafer possessing a gradient of surface energy shed more light on the relationship between surface wettability and capillary forces, These observations can be modeled in a general way using the Young-Laplace equation. The understanding of these capillary interactions at nanoscopic levels may have important applications, especially in the controlled deposition of liquid droplets on surfaces.
引用
收藏
页码:7823 / 7829
页数:7
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