DIRECT MEASUREMENT OF COLLOIDAL FORCES USING AN ATOMIC FORCE MICROSCOPE

被引:1744
作者
DUCKER, WA
SENDEN, TJ
PASHLEY, RM
机构
[1] AUSTRALIAN NATL UNIV,RES SCH PHYS SCI,DEPT APPL MATH,CANBERRA,ACT 2600,AUSTRALIA
[2] AUSTRALIAN NATL UNIV,FAC SCI,DEPT CHEM,CANBERRA,ACT 2600,AUSTRALIA
关键词
D O I
10.1038/353239a0
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
THE forces between colloidal particles dominate the behaviour of a great variety of materials, including paints, paper, soil, clays and (in some circumstances) cells. Here we describe the use of the atomic force microscope to measure directly the force between a planar surface and an individual colloid particle. The particle, a silica sphere of radius 3.5-mu-m, was attached to the force sensor in the microscope and the force between the particle and the surface was measured in solutions of sodium chloride. The measurements are consistent with the double-layer theory 1,2 of colloidal forces, although at very short distances there are deviations that may be attributed to hydration forces 3-6 or surface roughness, and with previous studies on macroscopic systems 4-6. Similar measurements should be possible for a wide range of the particulate and fibrous materials that are often encountered in industrial contexts, provided that they can be attached to the microscope probe.
引用
收藏
页码:239 / 241
页数:3
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