Determination of diffusion profiles of silver ions in soda-lime-silica glass by X-ray fluorescence spectrometry

被引：7

作者：

Bos, M ^{[1
]}

Boukamp, BA ^{[1
]}

Vrielink, JAM ^{[1
]}

机构：

[1] Univ Twente, Dept Chem Technol, NL-7500 AE Enschede, Netherlands

来源：

ANALYTICA CHIMICA ACTA | 2002年 / 459卷 / 02期

关键词：

X-ray fluorescence spectrometry; semi-infinite diffusion; diffusion profiles;

D O I：

10.1016/S0003-2670(02)00136-8

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

A nondestructive method based on X-ray fluorescence (XRF) spectrometry is presented for the determination of concentration-depth profiles in the top layer of flat solid samples. The method was tested in the determination of the interdiffusion coefficient of silver and sodium ions in soda-lime-silica glass. Calculations are based on semi-infinite diffusion with constant boundary concentration of the silver ion. The diffusion coefficient found at 633 K for penetration times between 300 and 3600 s ranged between 1.1 x 10(-10) and 1.6 x 10(-10) cm(2) s(-1). (C) 2002 Elsevier Science B.V. All rights reserved.

引用

页码：305 / 311

页数：7

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