Time-resolved imaging of current-induced domain-wall oscillations

被引:45
作者
Bocklage, Lars [1 ,2 ]
Krueger, Benjamin [3 ]
Eiselt, Rene [1 ,2 ]
Bolte, Markus [1 ,2 ]
Fischer, Peter [4 ]
Meier, Guido [1 ,2 ]
机构
[1] Univ Hamburg, Inst Angew Phys, D-20355 Hamburg, Germany
[2] Univ Hamburg, Zentrum Mikrostrukturforsch, D-20355 Hamburg, Germany
[3] Univ Hamburg, Inst Theoret Phys 1, D-20355 Hamburg, Germany
[4] Lawrence Berkeley Natl Lab, Ctr Xray Opt, Berkeley, CA 94720 USA
关键词
D O I
10.1103/PhysRevB.78.180405
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Current-induced domain-wall dynamics is investigated via high-resolution soft x-ray transmission microscopy by a stroboscopic pump-and-probe measurement scheme at a temporal resolution of 200 ps. A 180 degrees domain wall in a restoring potential of a permalloy microstructure is displaced from its equilibrium position by nanosecond current pulses leading to oscillations with velocities up to 325 m/s. The motion of the wall is described with an analytical model of a rigid domain wall in a nonharmonic potential allowing one to determine the mass of the domain wall. We show that Oersted fields dominate the domain-wall dynamics in our geometry.
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页数:4
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