Magnetic soft x-ray microscopy at 15 nm resolution probing nanoscale local magnetic hysteresis (invited)

被引:40
作者
Kim, Dong-Hyun [1 ]
Fischer, Peter
Chao, Weilun
Anderson, Erik
Im, Mi-Young
Shin, Sung-Chul
Choe, Sug-Bong
机构
[1] Univ Calif Berkeley, Lawrence Berkeley Lab, Ctr Xray Opt, Berkeley, CA 94720 USA
[2] Korea Adv Inst Sci & Technol, Dept Phys, Taejon 305701, South Korea
[3] Seoul Natl Univ, Dept Phys, Seoul 151742, South Korea
关键词
D O I
10.1063/1.2167060
中图分类号
O59 [应用物理学];
学科分类号
摘要
Recent progress in x-ray optics has pushed the lateral resolution of soft x-ray magnetic microscopy to below 15 nm. We have measured local magnetic hysteresis on a nanometer scale at the full-field x-ray microscope XM-1 at the Advanced Light Source in Berkeley, approaching fundamental length scales such as exchange lengths, Barkhausen lengths, and grain diameters. We have studied the evolution of magnetic domain patterns in a nanogranular CoCrPt film with a pronounced perpendicular magnetic anisotropy and revealed nanoscopic details associated with the granular film structure. From a quantitative analysis of the field-dependent magnetic domain patterns, we are able to generate local magnetic hysteresis map on a nanometer scale. Our findings indicate a significant variation of local coercive fields corresponding to the nanoscopic behavior of magnetic domains. (C) 2006 American Institute of Physics.
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页数:3
相关论文
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