Growth and characterization of CdTe single crystals for radiation detectors

被引:119
作者
Funaki, M [1 ]
Ozaki, T [1 ]
Satoh, K [1 ]
Ohno, R [1 ]
机构
[1] Japan Energy Corp, Cent R&D Lab, Toda, Saitama 3358502, Japan
关键词
CdTe; crystal growth; traveling heater method; radiation detector;
D O I
10.1016/S0168-9002(99)00607-5
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
To improve the productivity of CdTe radiation detectors, the crystal growth by traveling heater method (THM) as well as the quality of the fabricated detectors were investigated. In the THM growth, optimization of the solvent volume was found to be essential because it affects the shape of the growth interface. The use of the slightly tilted seed from [1 1 1]B was also effective to limit the generation of twins having different directions. Single-crystal (1 1 1) wafers, larger than 30 x 30 mm(2) were successfully obtained from a grown crystal of 50 mm diameter. Pt/CdTe/Pt detectors of dimensions 4 x 4 x 2 mm(3), fabricated from the whole crystal ingot, showed an energy resolution (FWHM of 122 keV peak from a Co-57 source) between 6% and 8%. Similarly, Pt/CdTe/In detectors of dimensions 2 x 2 x 0.5 mm(3) showed a resolution better than 3%. These characteristics encourage the practical applications of various types of CdTe detectors. (C) 1999 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:120 / 126
页数:7
相关论文
共 16 条
[1]   THE ABSOLUTE DETERMINATION OF CDTE CRYSTAL POLARITY [J].
BROWN, PD ;
DUROSE, K ;
RUSSELL, GJ ;
WOODS, J .
JOURNAL OF CRYSTAL GROWTH, 1990, 101 (1-4) :211-215
[2]   GROWTH OF HG-BASED ALLOYS BY THE TRAVELING HEATER METHOD [J].
COLOMBO, L ;
CHANG, RR ;
CHANG, CJ ;
BAIRD, BA .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (04) :2795-2799
[3]   Characterization of bulk CdZnTe by IR transmission imaging [J].
Doty, FP ;
Cozzatti, JP ;
Schomer, JP .
HARD X-RAY AND GAMMA-RAY DETECTOR PHYSICS, OPTICS, AND APPLICATIONS, 1997, 3115 :51-55
[4]   CdTe and CdZnTe materials for room-temperature X-ray and gamma ray detectors [J].
Eisen, Y ;
Shor, A .
JOURNAL OF CRYSTAL GROWTH, 1998, 184 :1302-1312
[5]   Analysis of Cd1-xZnxTe microstructure [J].
Heffelfinger, JR ;
Medlin, DL ;
Yoon, H ;
Hermon, H ;
James, RB .
HARD X-RAY AND GAMMA-RAY DETECTOR PHYSICS, OPTICS, AND APPLICATIONS, 1997, 3115 :40-50
[6]   Performance of a new schottky CdTe detector for hard X-ray spectroscopy [J].
Matsumoto, C ;
Takahashi, T ;
Takizawa, K ;
Ohno, R ;
Ozaki, T ;
Mori, K .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1998, 45 (03) :428-432
[7]   HIGH-QUALITY CDTE AND ITS APPLICATION TO RADIATION DETECTORS [J].
OHMORI, M ;
IWASE, Y ;
OHNO, R .
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1993, 16 (1-3) :283-290
[8]   GROWTH OF CADMIUM TELLURIDE CRYSTALS BY AN IMPROVED TRAVELING HEATER METHOD [J].
SCHOENHOLZ, R ;
DIAN, R ;
NITSCHE, R .
JOURNAL OF CRYSTAL GROWTH, 1985, 72 (1-2) :72-79
[9]  
SIFFERT P, 1983, MATER RES SOC S P, V16, P87
[10]   Fabrication of CdZnTe strip detectors for large area arrays [J].
Stahle, CM ;
Shi, ZQ ;
Hu, K ;
Barthelmy, SD ;
Snodgrass, SJ ;
Bartlett, LM ;
Shu, PK ;
Lehtonen, SJ ;
Mach, KJ .
HARD X-RAY AND GAMMA-RAY DETECTOR PHYSICS, OPTICS, AND APPLICATIONS, 1997, 3115 :90-97