Sign dependence of the X-ray magnetic linear dichroism on the antiferromagnetic spin axis in LaFeO3 thin films -: art. no. 020401

Photoemission electron microscopy has been used to determine the orientation of individual antiferromagnetic domains in LaFeO3 thin films. We found the antiferromagnetic axes are tilted by 20 degrees out of the surface plane and have a different sign of the x-ray magnetic linear dichroism compared to previous reports on LaFeO3. Using multiplet calculations, we show that this sign depends on the orientation of the magnetization with respect to the crystalline axes. This has important bearings on the correct analysis of the coupling between ferromagnetic and antiferromagnetic films in exchange bias systems.