Sign dependence of the X-ray magnetic linear dichroism on the antiferromagnetic spin axis in LaFeO3 thin films -: art. no. 020401

被引：60

作者：

Czekaj, S ^{[1
]}

Nolting, F

Heyderman, LJ

Willmott, PR

van der Laan, G

机构：

[1] Paul Scherrer Inst, CH-5232 Villigen, Switzerland

[2] Daresbury Lab, CCLRC, Warrington WA4 4AD, Cheshire, England

来源：

PHYSICAL REVIEW B | 2006年 / 73卷 / 02期

关键词：

D O I：

10.1103/PhysRevB.73.020401

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Photoemission electron microscopy has been used to determine the orientation of individual antiferromagnetic domains in LaFeO3 thin films. We found the antiferromagnetic axes are tilted by 20 degrees out of the surface plane and have a different sign of the x-ray magnetic linear dichroism compared to previous reports on LaFeO3. Using multiplet calculations, we show that this sign depends on the orientation of the magnetization with respect to the crystalline axes. This has important bearings on the correct analysis of the coupling between ferromagnetic and antiferromagnetic films in exchange bias systems.

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