Electroless remetallization of aluminum bond pads on CMOS driver chip for flip-chip attachment to vertical cavity surface emitting lasers (VCSEL's)

被引:29
作者
Datta, M [1 ]
Merritt, SA
Dagenais, M
机构
[1] Univ Maryland, Dept Elect Engn, College Pk, MD 20742 USA
[2] Uniphase Corp, Bloomfield, CT 06002 USA
[3] Lab Phys Sci, College Pk, MD 20740 USA
来源
IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES | 1999年 / 22卷 / 02期
关键词
ball shear test; electroless plating; flip-chip bonding; indium-lead solder; remetallization of aluminum; VCSEL packaging; wire-bonding;
D O I
10.1109/6144.774749
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A method for remetallizing the bond pads of electronic chips, which are initially metallized with aluminum or aluminum alloy is presented, Application of electroless plating process for the remetallization of aluminum to a solderable gold surface can reduce the cost and complication of the widely accepted flip chip interconnection technology. We have developed a step by step nickel/gold wafer bumping technique (remetallized bump height is 5.0 mu m) for the appropriate solder (15.0 mu m of In:Pb). Variation of roughness of the remetallized surface has been studied carefully. We have completed prototype research studies on test devices and successfully packaged the flip-chip bonded hybrid pair of a CMOS driver chip and a dummy structure of vertical cavity surface emitting laser (VCSEL) array, Cross section of the hip-chip solder joint is studied. Also, adhesion strength of the metal deposit is investigated.
引用
收藏
页码:299 / 306
页数:8
相关论文
共 12 条
[1]   AN INNOVATIVE BONDING TECHNIQUE FOR OPTICAL CHIPS USING SOLDER BUMPS THAT ELIMINATE CHIP POSITIONING ADJUSTMENTS [J].
HAYASHI, T .
IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY, 1992, 15 (02) :225-230
[2]   A NOVEL FLIP-CHIP INTERCONNECTION TECHNIQUE USING SOLDER BUMPS FOR HIGH-SPEED PHOTORECEIVERS [J].
KATSURA, K ;
HAYASHI, T ;
OHIRA, F ;
HATA, S ;
IWASHITA, K .
JOURNAL OF LIGHTWAVE TECHNOLOGY, 1990, 8 (09) :1323-1327
[3]  
Keping H., 1997, Met. Finish, V95, P73, DOI [10.1016/S0026-0576(97)81818-1, DOI 10.1016/S0026-0576(97)81818-1]
[4]  
KOELLE U, 1998, IEEE LEOS SUMM TOP M
[5]  
KOLEY B, 1999, P C OSA TOP M SPAT L
[6]  
KRISHNAMOORTHY AV, 1998, IEEE LEOS SUMM TOP M
[7]  
LAU JH, 1995, FLIP CHIP TECHNOLOGI, P226
[8]  
LEE YC, 1994, JOM-J MIN MET MAT S, V46, P46
[9]  
Ostmann A., 1993, Proceedings 1993 IEEE Multi-Chip Module Conference MCMC-93 (Cat. No.93CH3224-3), P74, DOI 10.1109/MCMC.1993.302148
[10]  
RIEDEL W, 1991, ELECTROLESS NICKEL P, pCH3