Temperature dependent nano indentation of thin polymer films with the scanning force microscope

被引：35

作者：

Hinz, M

Kleiner, A

Hild, S

Marti, O

Dürig, U

Gotsmann, B

Drechsler, U

Albrecht, TR

Vettiger, P

机构：

[1] Univ Ulm, Dept Expt Phys, D-89081 Ulm, Germany

[2] IBM Res GmbH, CH-8803 Ruschlikon, Switzerland

来源：

EUROPEAN POLYMER JOURNAL | 2004年 / 40卷 / 05期

关键词：

scanning force microscopy (SFM)/atomic force microscopy (AFM); polymer; polymethylmethacrylate (PMMA); thin film; force curves; elevated temperature; glass transition temperature; permanent impression; nanoindentation;

D O I：

10.1016/j.eurpolymj.2004.01.027

中图分类号：

O63 [高分子化学（高聚物）];

学科分类号：

070305 ; 080501 ; 081704 ;

摘要：

The scanning force microscope (SFM) was used to investigate the temperature dependent micro mechanical properties of polymethylmethacrylate (PMMA) films with a thickness of 35 nm in the range of the radius of gyration. Force-distance curves were performed in the glass transition range to create permanent nanometric indentations with maximal forces up to 4 pN. Quantitative measurements of the indentation depth during and after application of the force, hysteresis energy and slope of the loading part are carried out as function of sample temperature and applied force. The glass transition of the polymer film can be clearly identified by the change of the mechanical properties of the polymer. Surprisingly, only a small change of elasticity at the glass transition is observed. (C) 2004 Elsevier Ltd. All rights reserved.

引用

页码：957 / 964

页数：8

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