共 10 条
[1]
[Anonymous], 1999, INT TECHNOLOGY ROADM
[2]
80 nm poly-silicon gated n-FETs with ultra-thin Al2O3 gate dielectric for ULSI applications
[J].
Buchanan, DA
;
Gusev, EP
;
Cartier, E
;
Okorn-Schmidt, H
;
Rim, K
;
Gribelyuk, MA
;
Mocuta, A
;
Ajmera, A
;
Copel, M
;
Guha, S
;
Bojarczuk, N
;
Callegari, A
;
D'Emic, C
;
Kozlowski, P
;
Chan, K
;
Fleming, RJ
;
Jamison, PC
;
Brown, J
;
Arndt, R
.
INTERNATIONAL ELECTRON DEVICES MEETING 2000, TECHNICAL DIGEST,
2000,
:223-226

Buchanan, DA
论文数: 0 引用数: 0
h-index: 0
机构:
IBM Res, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA IBM Res, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA

Gusev, EP
论文数: 0 引用数: 0
h-index: 0
机构:
IBM Res, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA IBM Res, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA

Cartier, E
论文数: 0 引用数: 0
h-index: 0
机构:
IBM Res, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA IBM Res, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA

Okorn-Schmidt, H
论文数: 0 引用数: 0
h-index: 0
机构:
IBM Res, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA IBM Res, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA

Rim, K
论文数: 0 引用数: 0
h-index: 0
机构:
IBM Res, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA IBM Res, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA

Gribelyuk, MA
论文数: 0 引用数: 0
h-index: 0
机构:
IBM Res, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA IBM Res, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA

Mocuta, A
论文数: 0 引用数: 0
h-index: 0
机构:
IBM Res, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA IBM Res, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA

Ajmera, A
论文数: 0 引用数: 0
h-index: 0
机构:
IBM Res, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA IBM Res, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA

Copel, M
论文数: 0 引用数: 0
h-index: 0
机构:
IBM Res, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA IBM Res, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA

Guha, S
论文数: 0 引用数: 0
h-index: 0
机构:
IBM Res, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA IBM Res, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA

Bojarczuk, N
论文数: 0 引用数: 0
h-index: 0
机构:
IBM Res, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA IBM Res, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA

Callegari, A
论文数: 0 引用数: 0
h-index: 0
机构:
IBM Res, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA IBM Res, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA

D'Emic, C
论文数: 0 引用数: 0
h-index: 0
机构:
IBM Res, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA IBM Res, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA

Kozlowski, P
论文数: 0 引用数: 0
h-index: 0
机构:
IBM Res, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA IBM Res, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA

Chan, K
论文数: 0 引用数: 0
h-index: 0
机构:
IBM Res, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA IBM Res, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA

Fleming, RJ
论文数: 0 引用数: 0
h-index: 0
机构:
IBM Res, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA IBM Res, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA

Jamison, PC
论文数: 0 引用数: 0
h-index: 0
机构:
IBM Res, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA IBM Res, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA

Brown, J
论文数: 0 引用数: 0
h-index: 0
机构:
IBM Res, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA IBM Res, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA

Arndt, R
论文数: 0 引用数: 0
h-index: 0
机构:
IBM Res, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA IBM Res, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA
[3]
High quality La2O3 and Al2O3 gate dielectrics with equivalent oxide thickness 5-10Å
[J].
Chin, A
;
Wu, YH
;
Chen, SB
;
Liao, CC
;
Chen, WJ
.
2000 SYMPOSIUM ON VLSI TECHNOLOGY, DIGEST OF TECHNICAL PAPERS,
2000,
:16-17

Chin, A
论文数: 0 引用数: 0
h-index: 0
机构:
Natl Chiao Tung Univ, Dept Elect Engn, Hsinchu, Taiwan Natl Chiao Tung Univ, Dept Elect Engn, Hsinchu, Taiwan

Wu, YH
论文数: 0 引用数: 0
h-index: 0
机构:
Natl Chiao Tung Univ, Dept Elect Engn, Hsinchu, Taiwan Natl Chiao Tung Univ, Dept Elect Engn, Hsinchu, Taiwan

Chen, SB
论文数: 0 引用数: 0
h-index: 0
机构:
Natl Chiao Tung Univ, Dept Elect Engn, Hsinchu, Taiwan Natl Chiao Tung Univ, Dept Elect Engn, Hsinchu, Taiwan

Liao, CC
论文数: 0 引用数: 0
h-index: 0
机构:
Natl Chiao Tung Univ, Dept Elect Engn, Hsinchu, Taiwan Natl Chiao Tung Univ, Dept Elect Engn, Hsinchu, Taiwan

Chen, WJ
论文数: 0 引用数: 0
h-index: 0
机构:
Natl Chiao Tung Univ, Dept Elect Engn, Hsinchu, Taiwan Natl Chiao Tung Univ, Dept Elect Engn, Hsinchu, Taiwan
[4]
CLEMENS JT, 1975, BELL SYST TECH J, P687
[5]
Effect of polysilicon gate on the flatband voltage shift and mobility degradation for ALD-Al2O3 gate dielectric
[J].
Lee, JH
;
Koh, K
;
Lee, NI
;
Cho, MH
;
Kim, YK
;
Jeon, JS
;
Cho, KH
;
Shin, HS
;
Kim, MH
;
Fujihara, K
;
Kang, HK
;
Moon, JT
.
INTERNATIONAL ELECTRON DEVICES MEETING 2000, TECHNICAL DIGEST,
2000,
:645-648

Lee, JH
论文数: 0 引用数: 0
h-index: 0
机构:
Samsung Elect Co Ltd, Proc Dev Team, Yongin Si 449711, Kyunggi Do, South Korea Samsung Elect Co Ltd, Proc Dev Team, Yongin Si 449711, Kyunggi Do, South Korea

Koh, K
论文数: 0 引用数: 0
h-index: 0
机构:
Samsung Elect Co Ltd, Proc Dev Team, Yongin Si 449711, Kyunggi Do, South Korea Samsung Elect Co Ltd, Proc Dev Team, Yongin Si 449711, Kyunggi Do, South Korea

Lee, NI
论文数: 0 引用数: 0
h-index: 0
机构:
Samsung Elect Co Ltd, Proc Dev Team, Yongin Si 449711, Kyunggi Do, South Korea Samsung Elect Co Ltd, Proc Dev Team, Yongin Si 449711, Kyunggi Do, South Korea

Cho, MH
论文数: 0 引用数: 0
h-index: 0
机构:
Samsung Elect Co Ltd, Proc Dev Team, Yongin Si 449711, Kyunggi Do, South Korea Samsung Elect Co Ltd, Proc Dev Team, Yongin Si 449711, Kyunggi Do, South Korea

Kim, YK
论文数: 0 引用数: 0
h-index: 0
机构:
Samsung Elect Co Ltd, Proc Dev Team, Yongin Si 449711, Kyunggi Do, South Korea Samsung Elect Co Ltd, Proc Dev Team, Yongin Si 449711, Kyunggi Do, South Korea

Jeon, JS
论文数: 0 引用数: 0
h-index: 0
机构:
Samsung Elect Co Ltd, Proc Dev Team, Yongin Si 449711, Kyunggi Do, South Korea Samsung Elect Co Ltd, Proc Dev Team, Yongin Si 449711, Kyunggi Do, South Korea

Cho, KH
论文数: 0 引用数: 0
h-index: 0
机构:
Samsung Elect Co Ltd, Proc Dev Team, Yongin Si 449711, Kyunggi Do, South Korea Samsung Elect Co Ltd, Proc Dev Team, Yongin Si 449711, Kyunggi Do, South Korea

Shin, HS
论文数: 0 引用数: 0
h-index: 0
机构:
Samsung Elect Co Ltd, Proc Dev Team, Yongin Si 449711, Kyunggi Do, South Korea Samsung Elect Co Ltd, Proc Dev Team, Yongin Si 449711, Kyunggi Do, South Korea

Kim, MH
论文数: 0 引用数: 0
h-index: 0
机构:
Samsung Elect Co Ltd, Proc Dev Team, Yongin Si 449711, Kyunggi Do, South Korea Samsung Elect Co Ltd, Proc Dev Team, Yongin Si 449711, Kyunggi Do, South Korea

Fujihara, K
论文数: 0 引用数: 0
h-index: 0
机构:
Samsung Elect Co Ltd, Proc Dev Team, Yongin Si 449711, Kyunggi Do, South Korea Samsung Elect Co Ltd, Proc Dev Team, Yongin Si 449711, Kyunggi Do, South Korea

Kang, HK
论文数: 0 引用数: 0
h-index: 0
机构:
Samsung Elect Co Ltd, Proc Dev Team, Yongin Si 449711, Kyunggi Do, South Korea Samsung Elect Co Ltd, Proc Dev Team, Yongin Si 449711, Kyunggi Do, South Korea

Moon, JT
论文数: 0 引用数: 0
h-index: 0
机构:
Samsung Elect Co Ltd, Proc Dev Team, Yongin Si 449711, Kyunggi Do, South Korea Samsung Elect Co Ltd, Proc Dev Team, Yongin Si 449711, Kyunggi Do, South Korea
[6]
MA Y, 2000, IEDM, P149
[7]
Gate quality doped high K films for CMOS beyond 100 nm:: 3-10nm Al2O3 with low leakage and low interface states
[J].
Manchanda, L
;
Lee, WH
;
Bower, JE
;
Baumann, FH
;
Brown, WL
;
Case, CJ
;
Keller, RC
;
Kim, YO
;
Laskowski, EJ
;
Morris, MD
;
Opila, RL
;
Silverman, IJ
;
Sorsch, TW
;
Weber, GR
.
INTERNATIONAL ELECTRON DEVICES MEETING 1998 - TECHNICAL DIGEST,
1998,
:605-608

Manchanda, L
论文数: 0 引用数: 0
h-index: 0
机构:
AT&T Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA AT&T Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA

Lee, WH
论文数: 0 引用数: 0
h-index: 0
机构:
AT&T Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA AT&T Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA

Bower, JE
论文数: 0 引用数: 0
h-index: 0
机构:
AT&T Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA AT&T Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA

Baumann, FH
论文数: 0 引用数: 0
h-index: 0
机构:
AT&T Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA AT&T Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA

Brown, WL
论文数: 0 引用数: 0
h-index: 0
机构:
AT&T Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA AT&T Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA

Case, CJ
论文数: 0 引用数: 0
h-index: 0
机构:
AT&T Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA AT&T Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA

Keller, RC
论文数: 0 引用数: 0
h-index: 0
机构:
AT&T Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA AT&T Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA

Kim, YO
论文数: 0 引用数: 0
h-index: 0
机构:
AT&T Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA AT&T Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA

Laskowski, EJ
论文数: 0 引用数: 0
h-index: 0
机构:
AT&T Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA AT&T Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA

Morris, MD
论文数: 0 引用数: 0
h-index: 0
机构:
AT&T Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA AT&T Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA

Opila, RL
论文数: 0 引用数: 0
h-index: 0
机构:
AT&T Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA AT&T Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA

Silverman, IJ
论文数: 0 引用数: 0
h-index: 0
机构:
AT&T Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA AT&T Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA

Sorsch, TW
论文数: 0 引用数: 0
h-index: 0
机构:
AT&T Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA AT&T Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA

Weber, GR
论文数: 0 引用数: 0
h-index: 0
机构:
AT&T Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA AT&T Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA
[8]
Si-doped aluminates for high temperature metal-gate CMOS: Zr-Al-Si-O, a novel gate dielectric for low power applications
[J].
Manchanda, L
;
Green, ML
;
van Dover, RB
;
Morris, MD
;
Kerber, A
;
Hu, Y
;
Han, JP
;
Silverman, PJ
;
Sorsch, TW
;
Weber, G
;
Donnelly, V
;
Pelhos, K
;
Klemens, F
;
Ciampa, NA
;
Kornblit, A
;
Kim, YO
;
Bower, JE
;
Barr, D
;
Ferry, E
;
Jacobson, D
;
Eng, J
;
Busch, B
;
Schulte, H
.
INTERNATIONAL ELECTRON DEVICES MEETING 2000, TECHNICAL DIGEST,
2000,
:23-26

Manchanda, L
论文数: 0 引用数: 0
h-index: 0
机构:
Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA

Green, ML
论文数: 0 引用数: 0
h-index: 0
机构:
Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA

van Dover, RB
论文数: 0 引用数: 0
h-index: 0
机构:
Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA

Morris, MD
论文数: 0 引用数: 0
h-index: 0
机构:
Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA

Kerber, A
论文数: 0 引用数: 0
h-index: 0
机构:
Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA

Hu, Y
论文数: 0 引用数: 0
h-index: 0
机构:
Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA

Han, JP
论文数: 0 引用数: 0
h-index: 0
机构:
Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA

Silverman, PJ
论文数: 0 引用数: 0
h-index: 0
机构:
Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA

Sorsch, TW
论文数: 0 引用数: 0
h-index: 0
机构:
Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA

Weber, G
论文数: 0 引用数: 0
h-index: 0
机构:
Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA

Donnelly, V
论文数: 0 引用数: 0
h-index: 0
机构:
Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA

Pelhos, K
论文数: 0 引用数: 0
h-index: 0
机构:
Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA

Klemens, F
论文数: 0 引用数: 0
h-index: 0
机构:
Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA

Ciampa, NA
论文数: 0 引用数: 0
h-index: 0
机构:
Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA

Kornblit, A
论文数: 0 引用数: 0
h-index: 0
机构:
Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA

Kim, YO
论文数: 0 引用数: 0
h-index: 0
机构:
Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA

Bower, JE
论文数: 0 引用数: 0
h-index: 0
机构:
Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA

Barr, D
论文数: 0 引用数: 0
h-index: 0
机构:
Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA

Ferry, E
论文数: 0 引用数: 0
h-index: 0
机构:
Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA

Jacobson, D
论文数: 0 引用数: 0
h-index: 0
机构:
Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA

Eng, J
论文数: 0 引用数: 0
h-index: 0
机构:
Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA

Busch, B
论文数: 0 引用数: 0
h-index: 0
机构:
Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA

Schulte, H
论文数: 0 引用数: 0
h-index: 0
机构:
Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA
[9]
The electronic structure at the atomic scale of ultrathin gate oxides
[J].
Muller, DA
;
Sorsch, T
;
Moccio, S
;
Baumann, FH
;
Evans-Lutterodt, K
;
Timp, G
.
NATURE,
1999, 399 (6738)
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Muller, DA
论文数: 0 引用数: 0
h-index: 0
机构:
AT&T Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA AT&T Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA

Sorsch, T
论文数: 0 引用数: 0
h-index: 0
机构:
AT&T Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA AT&T Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA

Moccio, S
论文数: 0 引用数: 0
h-index: 0
机构:
AT&T Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA AT&T Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA

Baumann, FH
论文数: 0 引用数: 0
h-index: 0
机构:
AT&T Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA AT&T Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA

Evans-Lutterodt, K
论文数: 0 引用数: 0
h-index: 0
机构:
AT&T Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA AT&T Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA

Timp, G
论文数: 0 引用数: 0
h-index: 0
机构:
AT&T Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA AT&T Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA
[10]
Hafnium and zirconium silicates for advanced gate dielectrics
[J].
Wilk, GD
;
Wallace, RM
;
Anthony, JM
.
JOURNAL OF APPLIED PHYSICS,
2000, 87 (01)
:484-492

Wilk, GD
论文数: 0 引用数: 0
h-index: 0
机构:
Texas Instruments Inc, Cent Res Labs, Dallas, TX 75243 USA Texas Instruments Inc, Cent Res Labs, Dallas, TX 75243 USA

Wallace, RM
论文数: 0 引用数: 0
h-index: 0
机构:
Texas Instruments Inc, Cent Res Labs, Dallas, TX 75243 USA Texas Instruments Inc, Cent Res Labs, Dallas, TX 75243 USA

Anthony, JM
论文数: 0 引用数: 0
h-index: 0
机构:
Texas Instruments Inc, Cent Res Labs, Dallas, TX 75243 USA Texas Instruments Inc, Cent Res Labs, Dallas, TX 75243 USA