In situ TEM nanoindentation and deformation of Si-nanoparticle clusters

被引:21
作者
Lockwood, A. J. [1 ]
Inkson, B. J. [1 ]
机构
[1] Univ Sheffield, Dept Mat Engn, Sheffield S1 3JD, S Yorkshire, England
基金
英国工程与自然科学研究理事会;
关键词
TRANSMISSION ELECTRON-MICROSCOPE; SILICON NANOSPHERES; SPECIMEN SIZE; STRENGTH; HOLDER;
D O I
10.1088/0022-3727/42/3/035410
中图分类号
O59 [应用物理学];
学科分类号
摘要
The mechanical behaviour of clusters of interacting 50 nm Si nanoparticles has been characterized in real-time using a custom made in situ transmission electron microscope nanoindentation holder with axial stiffness 1800 N m(-1). The clusters of Si nanoparticles are mechanically loaded through a displacement controlled indentation using a W-tip indenter and experienced 0-55 mu N load. Real-time imaging of the deformation of the nanoparticle clusters shows localized orientation changes in the individual Si nanoparticles during loading followed by fracture of the cluster along a weak interface between two nanoparticles within the cluster.
引用
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页数:5
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