Cross-sectional time-resolved high-resolution transmission electron microscopy of atomic-scale contact and noncontact-type scannings on gold surfaces

被引：111

作者：

Kizuka, T ^{[1
]}

Yamada, K ^{[1
]}

Deguchi, S ^{[1
]}

Naruse, M ^{[1
]}

Tanaka, N ^{[1
]}

机构：

[1] JEOL LTD, AKISHIMA, TOKYO 196, JAPAN

来源：

PHYSICAL REVIEW B | 1997年 / 55卷 / 12期

关键词：

D O I：

10.1103/PhysRevB.55.R7398

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Atomic-scale contact and noncontact scannings on gold surfaces were performed by gold tips in time-resolved high-resolution transmission electron microscopy (HRTEM) using a piezodriven specimen holder. The structural variations of atomic arrangements in the scanning process were observed in situ with a time resolution of 1/60 s. Possibility of combination-type microscopy of HRTEM and scanning-probe microscopy was shown. Mechanical processing at one atomic-layer scale was demonstrated.

引用

页码：R7398 / R7401

页数：4

共 11 条

[1] ATOMIC FORCE MICROSCOPE
BINNIG, G
QUATE, CF
GERBER, C
[J]. PHYSICAL REVIEW LETTERS, 1986, 56 (09) : 930 - 933
[2] CONTRAST TRANSFER OF CRYSTAL IMAGES IN TEM
ISHIZUKA, K
[J]. ULTRAMICROSCOPY, 1980, 5 (01) : 55 - 65
[3] KIZUKA T, 1993, Z PHYS D ATOM MOL CL, V26, pS58, DOI 10.1007/BF01425617
[4] DYNAMIC HIGH-RESOLUTION ELECTRON-MICROSCOPY OF DIFFUSION BONDING BETWEEN ZINC-OXIDE NANOCRYSTALLITES AT AMBIENT-TEMPERATURE
KIZUKA, T
TANAKA, N
[J]. PHILOSOPHICAL MAGAZINE LETTERS, 1994, 69 (03) : 135 - 139
[5] REFLECTION ELECTRON-MICROSCOPE IMAGING OF AN OPERATING SCANNING TUNNELING MICROSCOPE
KUWABARA, M
LO, W
SPENCE, JCH
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1989, 7 (04): : 2745 - 2751
[6] LO WK, 1991, P 49 EL MICR SOC AM, P384
[7] OBSERVATION OF A VACUUM TUNNEL GAP IN A TRANSMISSION ELECTRON-MICROSCOPE USING A MICROMECHANICAL TUNNELING MICROSCOPE
LUTWYCHE, MI
WADA, Y
[J]. APPLIED PHYSICS LETTERS, 1995, 66 (21) : 2807 - 2809
[8] ATOMIC-SCALE FRICTION OF A TUNGSTEN TIP ON A GRAPHITE SURFACE
MATE, CM
MCCLELLAND, GM
ERLANDSSON, R
CHIANG, S
[J]. PHYSICAL REVIEW LETTERS, 1987, 59 (17) : 1942 - 1945
[9] SPENCE JCH, 1990, ULTRAMICROSCOPY, V33, P69, DOI 10.1016/0304-3991(90)90009-B
[10] A SCANNING TUNNELING MICROSCOPE IN A SIDE-ENTRY HOLDER FOR REFLECTION ELECTRON-MICROSCOPY IN THE PHILIPS EM400
SPENCE, JCH
[J]. ULTRAMICROSCOPY, 1988, 25 (02) : 165 - 169

← 1 2 →