REFLECTION ELECTRON-MICROSCOPE IMAGING OF AN OPERATING SCANNING TUNNELING MICROSCOPE

被引：23

作者：

KUWABARA, M

LO, W

SPENCE, JCH

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1989年 / 7卷 / 04期

关键词：

D O I：

10.1116/1.575785

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：2745 / 2751

页数：7

共 19 条

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[6]

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[7]

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[8] ANOMALOUS REFLECTED IMAGES OF OBJECTS ON CRYSTAL-SURFACES IN REFLECTION ELECTRON-MICROSCOPY [J].

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