LEEM studies of the microstructure and magnetic domain structure of ultrathin films

被引:10
作者
Bauer, E [1 ]
Duden, T [1 ]
Pinkvos, H [1 ]
Poppa, H [1 ]
Wurm, K [1 ]
机构
[1] IBM CORP, ALMADEN RES CTR, SAN JOSE, CA 95120 USA
关键词
D O I
10.1016/0304-8853(95)00764-4
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
LEEM, SPLEEM and other studies of Co and Cu on W(110) are reviewed. Single, double and sandwich layers are used to illustrate the interrelation between growth, atomic and electronic structure, microstructure and magnetic domain structure in ultrathin film systems.
引用
收藏
页码:1 / 6
页数:6
相关论文
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