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Growth, microstructure, and electrochemical oxidation of MBE-grown c-axis La2CuO4 thin films
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Combination of EBSP measurements and SIMS to study crystallographic orientation dependence of diffusivities in a polycrystalline material: Oxygen tracer diffusion in La2-xSrxCuO4+/-delta
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MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY,
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Critical temperature enhancement by means of substrate-induced pressure
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SUPERCONDUCTING AND RELATED OXIDES: PHYSICS AND NANOENGINEERING III,
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Growth of (001)La1.85Sr0.15CuO4 ultrathin films without buffer or cap layers
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PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS,
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