Growth of (001)La1.85Sr0.15CuO4 ultrathin films without buffer or cap layers

被引：22

作者：

Sato, H

Yamamoto, H

Naito, M

机构：

[1] NTT Basic Research Laboratories, Wakamiya, Kanagawa, 243-01, 3-1, Morinosato

来源：

PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS | 1997年 / 274卷 / 3-4期

关键词：

La2-xSrxCuO4; thin films; ultrathin films;

D O I：

10.1016/S0921-4534(96)00676-4

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We report the growth of (001) La1.85Sr0.15CuO4 films with thicknesses less than 5 unit cells on LaSrAlO4 substrates without any buffer or cap layers. Results of surface analyses indicate that all samples with 0.5-unit-cells-thick films are well crystallized and have a finite density of states at the Fermi level. Films 4 unit cells thick show bulk-like transport properties and T-c(R = 0). T-c disappears in films with thicknesses less than 2 unit cells, suggesting that the minimum number of CuO2 planes necessary for superconductivity in LSCO is less than or equal to four, (C) 1996 Elsevier Science B.V.

引用

收藏

页码：227 / 231

页数：5

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