Surface potential images of polycrystalline organic semiconductors obtained by Kelvin probe force microscopy

被引：28

作者：

Huang, Haichao ^{[1
]}

Wang, Haibo ^{[1
]}

Zhang, Jidong ^{[1
]}

Yan, Donghang ^{[1
]}

机构：

[1] Chinese Acad Sci, Grad Sch, Changchun Inst Appl Chem, State Key Lab Polymer Phys & Chem, Changchun 130022, Peoples R China

来源：

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 2009年 / 95卷 / 01期

基金：

中国国家自然科学基金;

关键词：

FIELD-EFFECT TRANSISTORS; THIN-FILM TRANSISTORS; SOLAR-CELLS; GRAIN-BOUNDARY; WORK FUNCTION; INTERFACE; TRANSPORT; RESISTANCE; BLENDS;

D O I：

10.1007/s00339-008-5035-8

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

P-type copper phthalocyanine (CuPc) and n-type hexadecafluorophthalocyanina-tocopper (F16CuPc) polycrystalline films were investigated by Kelvin probe force microscopy (KPFM). Topographic and corresponding surface potential images are obtained simultaneously. Surface potential images are related with the local work function of crystalline facets and potential barriers at the grain boundaries (GBs) in organic semiconductors. Based on the spatial distribution of surface potential at GBs, donor- and acceptor-like trapping states in the grain boundaries (GBs) of p-CuPc and n-F16CuPc films are confirmed respectively. In view of spatial energy spectrum in micro-scale provided by KPFM, it is going to be a powerful tool to characterize the local electronic properties of organic semiconductors.

引用

页码：125 / 130

页数：6

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