Noncontact potentiometry of polymer field-effect transistors

被引：301

作者：

Bürgi, L ^{[1
]}

Sirringhaus, H ^{[1
]}

Friend, RH ^{[1
]}

机构：

[1] Univ Cambridge, Cavendish Lab, Cambridge CB3 0HE, England

来源：

APPLIED PHYSICS LETTERS | 2002年 / 80卷 / 16期

关键词：

D O I：

10.1063/1.1470702

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We report on high-resolution potentiometry of operating organic thin-film field-effect transistors by means of scanning Kelvin probe force microscopy. It is demonstrated that the measured potential reflects the electrostatic potential of the accumulation layer at the semiconductor/insulator interface. We present data revealing gate bias and lateral electric field dependence of the field-effect mobility in poly(hexylthiophene) at temperatures from 50 to 300 K. (C) 2002 American Institute of Physics.

引用

页码：2913 / 2915

页数：3

共 20 条

[1] Kelvin probe force microscopy for potential distribution measurement of cleaved surface of GaAs devices
Arakawa, M
Kishimoto, S
Mizutani, T
[J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1997, 36 (3B): : 1826 - 1829
[2] Large-scale complementary integrated circuits based on organic transistors
Crone, B
Dodabalapur, A
Lin, YY
Filas, RW
Bao, Z
LaDuca, A
Sarpeshkar, R
Katz, HE
Li, W
[J]. NATURE, 2000, 403 (6769) : 521 - 523
[3] High-performance all-polymer integrated circuits
Gelinck, GH
Geuns, TCT
de Leeuw, DM
[J]. APPLIED PHYSICS LETTERS, 2000, 77 (10) : 1487 - 1489
[4] Hassenkam T, 2001, ADV MATER, V13, P631, DOI 10.1002/1521-4095(200105)13:9<631::AID-ADMA631>3.3.CO
[5] 2-6
[6] Resolution and contrast in Kelvin probe force microscopy
Jacobs, HO
Leuchtmann, P
Homan, OJ
Stemmer, A
[J]. JOURNAL OF APPLIED PHYSICS, 1998, 84 (03) : 1168 - 1173
[7] Gate voltage dependent resistance of a single organic semiconductor grain boundary
Kelley, TW
Frisbie, CD
[J]. JOURNAL OF PHYSICAL CHEMISTRY B, 2001, 105 (20) : 4538 - 4540
[8] SILICON PN JUNCTION IMAGING AND CHARACTERIZATIONS USING SENSITIVITY ENHANCED KELVIN PROBE FORCE MICROSCOPY
KIKUKAWA, A
HOSAKA, S
IMURA, R
[J]. APPLIED PHYSICS LETTERS, 1995, 66 (25) : 3510 - 3512
[9] Cantilever effects on the measurement of electrostatic potentials by scanning Kelvin probe microscopy
Koley, G
Spencer, MG
Bhangale, HR
[J]. APPLIED PHYSICS LETTERS, 2001, 79 (04) : 545 - 547
[10] Frequency-dependent electrical response of holes in poly(p-phenylene vinylene)
Martens, HCF
Brom, HB
Blom, PWM
[J]. PHYSICAL REVIEW B, 1999, 60 (12): : R8489 - R8492

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