Infrared reflectance as a tool to reveal preferential molecular orientation of polymers adsorbed onto flat substrates

被引:3
作者
Brogly, M [1 ]
Bistac, S [1 ]
Schultz, J [1 ]
机构
[1] Univ Haute Alsace, CNRS, Inst Chim Surfaces & Interfaces, F-68057 Mulhouse, France
关键词
D O I
10.1002/masy.19991410113
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
FTIR-Reflectance experiments have been made on thin ethylene-vinyl acetate (EVA) copolymer layers deposited on aluminum mirrors in order to determine orientation of polymer functional groups at the interface. This was accomplished by using various reflection angles under p polarization state of the incident IR beam. Film thicknesses were estimated by ellipsometric experiments. Kramers-Kronig analysis is first applied to the external infrared reflection spectrum from a single copolymer surface measured near the normal incidence angle. Absorption spectra, k(v), are then deduced and used to calculate specular reflectance intensities of the functional groups of interest as a function of incidence angle, polarization state and film thickness. The calculated values are compared to those observed. A layer model is developed, which allows the molecular orientation of both EVA carbonyl groups and the main chain axis at the interface to be determined. Only carbonyl groups involved in specific electron donor-electron acceptor interactions at the interface appear to be subject to specific orientation. A persistence thickness of the preferential orientation in the film is determined, also from which it is concluded that even in nanofilms, preferential molecular orientation induced by an hydroxylated substrate does not persist throughout the film thickness. It is localized at a near interfacial region, the thickness of which depends on the ability of the comonomer to undergo conformational changes.
引用
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页码:129 / 143
页数:15
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