Antimonide-based devices for thermophotovoltaic applications

被引:43
作者
Hitchcock, CW [1 ]
Gutmann, RJ
Borrego, JM
Bhat, IB
Charache, GW
机构
[1] Rensselaer Polytech Inst, Ctr Integrated Elect & Elect Mfg, Troy, NY 12180 USA
[2] Lockheed Martin Inc, Schenectady, NY 12301 USA
关键词
gallium antimonide; gallium indium antimonide; gallium indium arsenide antimonide; thermophotovoltaics;
D O I
10.1109/16.792011
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Thermophotovoltaic (TPV) devices have been fabricated using ternary and quaternary layers grown by metalorganic vapor phase epitaxy. (MOVPE) on GaSb substrates, GaInSb ternary devices were grown with buffer layers to accommodate the lattice mismatch, and GaInAsSb quaternary devices were grown with Lattice-matched compositions. Improved devices are obtained when optical absorption occurs in the p-layer due to the longer minority carrier diffusion length. Thick emitter p/n devices are limited by surface recombination, with highest quantum efficiency and lowest dark current being achieved with epitaxially grown surface passivation layers on lattice-matched MOVPE quaternaries, Thin emitter/thick base, n/p devices are very promising since surface passivation is less critical than for p-emitter devices.
引用
收藏
页码:2154 / 2161
页数:8
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