Near field optics and magnetism

被引：9

作者：

Souche, Y

Schlenker, M

Raphel, R

Alvarez-Prado, L

机构：

[1] CNRS, Lab Louis Neel, FR-38042 Grenoble 9, France

[2] Fac Ciencias, Dept Fis, ES-33007 Oviedo, Spain

来源：

MAGNETISM, MAGNETIC MATERIALS AND THEIR APPLICATIONS | 1999年 / 302-3卷

关键词：

microscopy; magneto-optics; domains; Rayleigh criterion; local probe;

D O I：

10.4028/www.scientific.net/MSF.302-303.105

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Near field optical microscopy allows resolution far beyond the half wavelength that corresponds to the Rayleigh criterion. This is achieved by detecting the evanescent waves in the near field, typically some nanometers, from the object. Optical and topographic images are made simultaneously by scanning the surface. High resolution images of magnetic domains or singularities were obtained with a combination of near field optical microscopy and magnetooptical effects. A wide review of results will be presented.

引用

页码：105 / 114

页数：10

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