Dense arrays of nanopores as x-ray lithography masks

被引:9
作者
Knaack, SA [1 ]
Eddington, J
Leonard, Q
Cerrina, F
Onellion, M
机构
[1] Univ Wisconsin, Ctr Nanotechnol, Dept Phys, Madison, WI 53706 USA
[2] Univ Wisconsin, Ctr Nanotechnol, Dept Elect & Comp Engn, Madison, WI 53706 USA
关键词
D O I
10.1063/1.1705724
中图分类号
O59 [应用物理学];
学科分类号
摘要
An anodized aluminum oxide nanopore has been used as an x-ray lithography mask to achieve a feature size of similar to35 nm on the polymethylmethacrylate photoresist. The mask was exposed using synchrotron radiation and demonstrates the feasibility of forming large arrays of regular nanostructures. (C) 2004 American Institute of Physics.
引用
收藏
页码:3388 / 3390
页数:3
相关论文
共 12 条
[1]   100 nm gate hole openings for low voltage driving field emission display applications [J].
Choi, JO ;
Akinwande, AI ;
Smith, HI .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2001, 19 (03) :900-903
[2]  
COLE R, 1992, P SOC PHOTO-OPT INS, V1671, P461, DOI 10.1117/12.136048
[3]   Self-organized formation of hexagonal pore structures in anodic alumina [J].
Jessensky, O ;
Muller, F ;
Gosele, U .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1998, 145 (11) :3735-3740
[4]   Self-organized formation of hexagonal pore arrays in anodic alumina [J].
Jessensky, O ;
Muller, F ;
Gosele, U .
APPLIED PHYSICS LETTERS, 1998, 72 (10) :1173-1175
[5]  
KAHN M, 2001, J VAC SCI TECHNOL B, V19, P2423
[6]   Hexagonal pore arrays with a 50-420 nm interpore distance formed by self-organization in anodic alumina [J].
Li, AP ;
Muller, F ;
Birner, A ;
Nielsch, K ;
Gosele, U .
JOURNAL OF APPLIED PHYSICS, 1998, 84 (11) :6023-6026
[7]  
LIU SC, COMMUNICATION
[8]   ORDERED METAL NANOHOLE ARRAYS MADE BY A 2-STEP REPLICATION OF HONEYCOMB STRUCTURES OF ANODIC ALUMINA [J].
MASUDA, H ;
FUKUDA, K .
SCIENCE, 1995, 268 (5216) :1466-1468
[9]  
Nielsch K, 2002, NANO LETT, V2, P677, DOI [10.1021/nl025537k, 10.1021/n1025537k]
[10]   Fabrication of patterned media for high density magnetic storage [J].
Ross, CA ;
Smith, HI ;
Savas, T ;
Schattenburg, M ;
Farhoud, M ;
Hwang, M ;
Walsh, M ;
Abraham, MC ;
Ram, RJ .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1999, 17 (06) :3168-3176