Supersonic jet epitaxy of III-nitride semiconductors

被引:18
作者
Ferguson, BA [1 ]
Mullins, CB [1 ]
机构
[1] UNIV TEXAS, DEPT CHEM ENGN, AUSTIN, TX 78712 USA
基金
美国国家科学基金会;
关键词
D O I
10.1016/S0022-0248(97)00080-8
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
In this review we report On the application of supersonic jets towards growth of the III-nitride semiconductors AlN, GaN, and InN. Certain properties of supersonic jets provide unique advantages for film growth. A seeded jet is able to accelerate precursors to kinetic energies which are one to two orders of magnitude higher than the average kinetic energies in a typical CVD environment, which has been shown to enhance precursor adsorption and thus growth rate. Indeed, dual seeded supersonic jets have been effectively employed to grow GaN and AlN from organometallic precursors and ammonia. Supersonic jets can also be coupled with excitation sources to provide highly reactive precursors far film growth. For example, a supersonic plasma jet has been developed to generate atomic nitrogen, and this source has been used together with an effusion fell for gallium delivery to produce epitaxial GaN films. The tightly focused jet exit stream generates a very high peak flux at the centerline which produced a film growth rate of 0.65 mu m/h. However, deposition nonuniformity is quire dramatic due to this focusing and due to the point source nature of supersonic jets. Relatively few studies of III-nitride supersonic jet epitaxy have been reported, so further work is needed to evaluate the usefulness of this growth technique.
引用
收藏
页码:134 / 146
页数:13
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