Unique determination of multiple cracks by two measurements

被引：58

作者：

Alessandrini, G

Valenzuela, AD

机构：

[1] Dipartimento di Scienze Matematiche, Univ. degli Studi di Trieste, 34100 Trieste

[2] Providencia 2457, Santiago

来源：

SIAM JOURNAL ON CONTROL AND OPTIMIZATION | 1996年 / 34卷 / 03期

关键词：

inverse problems; cracks; elliptic equations; level curves;

D O I：

10.1137/S0363012994262853

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

We study the inverse problem of determining multiple cracks in a planar conductor by electrostatic measurements at the boundary. We prove that two measurements at the boundary suffice to identify multiple cracks with any number of components. We treat the problem under no regularity assumptions on the cracks and on the background conductivity.

引用

页码：913 / 921

页数：9

共 10 条

[1] ELLIPTIC-EQUATIONS IN DIVERGENCE FORM, GEOMETRIC CRITICAL-POINTS OF SOLUTIONS, AND STEKLOFF EIGENFUNCTIONS [J].