Determination of atom-surface van der Waals potentials from transmission-grating diffraction intensities

被引:163
作者
Grisenti, RE
Schöllkopf, W
Toennies, JP
Hegerfeldt, CC
Köhler, T
机构
[1] Max Planck Inst Stromungsforsch, D-37073 Gottingen, Germany
[2] Univ Gottingen, Inst Theoret Phys, D-37073 Gottingen, Germany
关键词
D O I
10.1103/PhysRevLett.83.1755
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Molecular beams of rare gas atoms and D-2 have been diffracted from 100-nm-period SiNx transmission gratings; The relative intensities of the diffraction peaks out to the eighth order depend on the diffracting particle and are interpreted in terms of effective slit widths. These differences have been analyzed by a new theory which accounts for the long-range van der Waals -C-3/l(3) interaction of the particles with the walls of the grating bars. The values of the C-3 constant for two different gratings are in good agreement and the results exhibit the expected linear dependence on the dipole polarizability.
引用
收藏
页码:1755 / 1758
页数:4
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