Multipurpose sensor tips for scanning near-field microscopy

被引：96

作者：

Mihalcea, C

Scholz, W

Werner, S

Munster, S

Oesterschulze, E

Kassing, R

机构：

[1] Institute of Technical Physics, University of Kassel

来源：

APPLIED PHYSICS LETTERS | 1996年 / 68卷 / 25期

关键词：

D O I：

10.1063/1.116520

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The reproducible micromachining of hollow metal tips on Si cantilevers and their applicability to scanning probe microscopy techniques are described. Provided with apertures below 130 nm and hollow pyramidal tips proved to be highly suited probes for scanning near-field optical microscopy (SNOM). First results of combined SFM/SNOM measurements together with scanning electron microscopy (SEM) photographs of the new sensors are presented. The SNOM images show a resolution of about 100 nm demonstrating the usefulness of these probes. (C) 1996 American Institute of Physics.

引用

页码：3531 / 3533

页数：3

共 13 条

[1] SUPER-RESOLUTION APERTURE SCANNING MICROSCOPE [J].