Radiation damage and transmission enhancement in surface-emitting organic light-emitting diodes

被引：24

作者：

Hung, LS ^{[1
]}

Madathil, J

机构：

[1] City Univ Hong Kong, COSDAF, Hong Kong, Hong Kong, Peoples R China

[2] City Univ Hong Kong, Dept Phys & Mat Sci, Hong Kong, Hong Kong, Peoples R China

[3] Eastman Kodak Co, Elect Imaging Prod, Rochester, NY 14650 USA

来源：

THIN SOLID FILMS | 2002年 / 410卷 / 1-2期

关键词：

optoelectronic devices; organic semiconductors; radiation damage; sputtering;

D O I：

10.1016/S0040-6090(02)00270-5

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A systematic study has been carried out on organic light-emitting diodes (OLEDs) with a transparent MgAg/ITO cathode. The most dominant imperfections in surface-emitting OLEDs were electrical shorts and attributed to radiation damage incurring in ITO deposition due to the presence of pinholes in the MgAg protective layer. When adding an ITO surface layer on a semitransparent MgAg thin film. an increase in luminance efficiency was observed and exhibited a strong dependence on ITO thickness. By carefully selecting processing conditions and device layer structures we fabricated surface-emitting OLEDs with excellent luminance efficiency and good operational stability. (C) 2002 Elsevier Science B.V. All rights reserved.

引用

页码：101 / 106

页数：6

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