Mobility of electronic charge carriers in titanium dioxide

被引:68
作者
Bak, T. [1 ]
Nowotny, M. K. [1 ]
Sheppard, L. R. [1 ]
Nowotny, J. [1 ]
机构
[1] Univ New S Wales, Sch Mat Sci & Engn, Ctr Mat Res Energy Convers, Sydney, NSW 2052, Australia
基金
澳大利亚研究理事会;
关键词
D O I
10.1021/jp801028j
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The present work reports the mobility of electronic charge carriers for well-defined TiO2. The mobility terms were determined by using the electrical conductivity for high-purity TiO2, including both single-crystal and polycrystalline specimens. The concentrations of electronic charge carriers were derived from defect disorder diagrams. The determined data indicate that the transport of electrons and holes occurs according to the band model and the hopping model, respectively. The differences in the electrical conductivity data between the single-crystal and polycrystalline specimens are considered within two scenarios: (1) The difference is due to the mobility terms. This scenario indicates that (i) the mobility of electrons for polycrystalline specimens is larger than that for the single crystal, and (ii) the mobility of electron holes for polycrystalline specimens is smaller than that for the single crystal. (2) The effect is due to the concentration terms. The analysis of data according to this scenario indicates that the concentration of electrons in the n-type regime for polycrystalline specimen is larger than that in the TiO2 single crystal. The mobility and the concentration data are considered in terms of the effect of grain boundaries on the charge transport in polycrystalline TiO2. The obtained data indicate that the charge transport in polycrystalline specimens may be modified in a controlled manner by grain boundary engineering.
引用
收藏
页码:12981 / 12987
页数:7
相关论文
共 27 条
[1]   Defect disorder of titanium dioxide [J].
Bak, T. ;
Nowotny, J. ;
Nowotny, M. K. .
JOURNAL OF PHYSICAL CHEMISTRY B, 2006, 110 (43) :21560-21567
[2]   Defect chemistry and semiconducting properties of titanium dioxide: III. Mobility of electronic charge carriers [J].
Bak, T ;
Nowotny, J ;
Rekas, M ;
Sorrell, CC .
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 2003, 64 (07) :1069-1087
[3]   ELECTRICAL-CONDUCTIVITY IN NON-STOICHIOMETRIC TITANIUM-DIOXIDE AT ELEVATED-TEMPERATURES [J].
BALACHANDRAN, U ;
EROR, NG .
JOURNAL OF MATERIALS SCIENCE, 1988, 23 (08) :2676-2682
[4]   ELECTRICAL CONDUCTIVITY OF NONSTOICHIOMETRIC RUTILE SINGLE CRYSTALS FROM 1000 DEGREES TO 1500 DEGREES C [J].
BLUMENTHAL, RN ;
COBURN, J ;
BAUKUS, J ;
HIRTHE, WM .
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1966, 27 (04) :643-+
[5]   ELECTRONIC MOBILITY IN RUTILE (TIO2) AT HIGH TEMPERATURES [J].
BLUMENTHAL, RN ;
KIRK, JC ;
HIRTHE, WM .
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1967, 28 (06) :1077-+
[6]   HALL MOBILITY OF REDUCED RUTILE IN TEMPERATURE RANGE 300-125 DEGREES K [J].
BRANSKY, I ;
TANNHAUSER, DS .
SOLID STATE COMMUNICATIONS, 1969, 7 (01) :245-+
[7]   Photoinduced reactivity of titanium dioxide [J].
Carp, O ;
Huisman, CL ;
Reller, A .
PROGRESS IN SOLID STATE CHEMISTRY, 2004, 32 (1-2) :33-177
[8]   POINT-DEFECTS AND CHARGE TRANSPORT IN PURE AND CHROMIUM-DOPED RUTILE AT 1273-K [J].
CARPENTIER, JL ;
LEBRUN, A ;
PERDU, F .
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1989, 50 (02) :145-151
[9]   Curve fitting with least squares [J].
de Levie, R .
CRITICAL REVIEWS IN ANALYTICAL CHEMISTRY, 2000, 30 (01) :59-74
[10]   ELECTROCHEMICAL PHOTOLYSIS OF WATER AT A SEMICONDUCTOR ELECTRODE [J].
FUJISHIMA, A ;
HONDA, K .
NATURE, 1972, 238 (5358) :37-+