Efficient nonlinear algorithm for envelope detection in white light interferometry

被引:382
作者
Larkin, KG
机构
[1] Department of Physical Optics, The University of Sydney
来源
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION | 1996年 / 13卷 / 04期
关键词
interferometry; white light interferometry; interference microscopy; phase-shifting algorithm; low coherence; nonlinear filter; envelope detection; demodulation;
D O I
10.1364/JOSAA.13.000832
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A compact and efficient algorithm for digital envelope detection in white light interferograms is derived from a well-known phase-shifting algorithm. The performance of the new algorithm is compared with that of Principal criteria considered are computational efficiency and accuracy in The new algorithm is shown to be near optimal in terms of computational efficiency and can be represented as a second-order nonlinear filter. In combination with a carefully designed peak detection method the algorithm exhibits exceptionally good performance on simulated interferograms. (C) 1996 Optical Society of America
引用
收藏
页码:832 / 843
页数:12
相关论文
共 49 条
[1]   ELIMINATION OF SYSTEMATIC-ERROR IN SUBPIXEL ACCURACY CENTROID ESTIMATION [J].
ALEXANDER, BF ;
NG, KC .
OPTICAL ENGINEERING, 1991, 30 (09) :1320-1331
[2]   UNDERSAMPLING ERRORS IN MEASURING THE MOMENTS OF IMAGES ABERRATED BY TURBULENCE [J].
BAREKET, N .
APPLIED OPTICS, 1979, 18 (17) :3064-3069
[3]  
Bogner R. E., 1975, INTRO DIGITAL FILTER
[4]   CONDITIONS FOR POSITIVITY OF AN ENERGY OPERATOR [J].
BOVIK, AC ;
MARAGOS, P .
IEEE TRANSACTIONS ON SIGNAL PROCESSING, 1994, 42 (02) :469-471
[5]  
Bracewell R., 1984, FOURIER TRANSFORM IT
[6]  
Brigham E.O., 1988, The Fast Fourier Transform and Its Applications
[7]  
BUSHAN B, 1985, APPL OPTICS, V24, P1489
[8]   INTERFEROMETRIC PROFILER FOR ROUGH SURFACES [J].
CABER, PJ .
APPLIED OPTICS, 1993, 32 (19) :3438-3441
[9]  
Carre P., 1966, METROLOGIA, V2, P13, DOI DOI 10.1088/0026-1394/2/1/005
[10]   3-DIMENSIONAL IMAGE REALIZATION IN INTERFERENCE MICROSCOPY [J].
CHIM, SSC ;
KINO, GS .
APPLIED OPTICS, 1992, 31 (14) :2550-2553