Photoresists for 193-nm lithography

被引:63
作者
Allen, RD
Wallraff, GM
Hofer, DC
Kunz, RR
机构
[1] IBM Research Division, Almaden Research Center, San Jose, CA 95120
[2] Lithography Group, IBM Almaden Research Center
[3] Gannon College, Erie, PA
[4] Bethel College, SD
[5] Lincoln Laboratory, Massachusetts Inst. of Technology, Lexington
[6] University of North Carolina, Chapel Hill, NC
[7] Submicrometer Technology Group, MIT Lincoln Laboratory
关键词
D O I
10.1147/rd.411.0095
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Photolithography using 193-nm light appears to be a viable route for the extension of optical lithography to the dimensions required for the manufacture of 1Gb DRAM and advanced CMOS microprocessors with 180-140-nm minimum feature sizes. In this paper, we discuss the origin of resist technology for 193-nm lithography and the current status of 193-nm photoresists, focusing on single-layer resist materials. We emphasize the photoresist design approaches under investigation, compare these with deep-UV (DUV) (248-nm) resist design and materials, and consider possible future lithography processes employing 193-nm lithography. Research and development on 193-nm photoresists by the lithography group at the IBM Almaden Research Center is highlighted.
引用
收藏
页码:95 / 104
页数:10
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