Cross-sectional transmission electron microscopy characterisation of plasma immersion ion implanted austenitic stainless steel

被引:32
作者
Li, X [1 ]
Samandi, M [1 ]
Dunne, D [1 ]
Collins, G [1 ]
Tendys, J [1 ]
Short, K [1 ]
Hutchings, R [1 ]
机构
[1] AUSTRALIAN NUCL SCI & TECHNOL ORG,MENAI,NSW 2234,AUSTRALIA
关键词
ion implantation; stainless steel; amorphous; PI3; XTEM;
D O I
10.1016/0257-8972(96)02879-4
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Cross-sectional transmission electron microscopy (XTEM), selected area diffraction (SAD) and nano;beam diffraction (NBD) techniques were used to investigate the surface microstructure of 316 stainless steel, implanted with high doses of nitrogen ions at 150, 250, 350, 450 and 520 degrees C using plasma immersion ion implantation. It has been found that the treatment temperature has a strong influence on the evolution of the microstructure. An amorphous layer of about 1 mu m thick with a heavily stressed substrate underneath was observed on the 150 degrees C implanted sample. Both the 250 and 350 degrees C implanted samples showed a thin nanocrystalline sublayer at the outermost surface and an amorphous sublayer between the nanocrystalline sublayer and the substrate. A thick amorphous layer up to 3 mu m thick was formed on the 450 degrees C implanted sample whereas at 520 degrees C, cellular precipitation of CrN and alpha-ferrite dominated the system. It is suggested that a solid state chemical reaction and the poor mobility of the reactant atoms are the key factors for the solid state amorphisation by nitrogen ion implantation into austenite.
引用
收藏
页码:28 / 36
页数:9
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