Size- and strain-dependent electronic structures in H-passivated Si [112] nanowires

被引:21
作者
Huang, Li [1 ,2 ]
Lu, Ning [1 ,3 ]
Yan, Jia-An [2 ]
Chou, M. Y. [2 ]
Wang, Cai-Zhuang [1 ,3 ]
Ho, Kai-Ming [1 ,3 ]
机构
[1] US DOE, Ames Lab, Ames, IA 50011 USA
[2] Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA
[3] Iowa State Univ, Dept Phys, Ames, IA 50011 USA
基金
美国国家科学基金会;
关键词
D O I
10.1021/jp802591v
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 [物理化学]; 081704 [应用化学];
摘要
Using first-principles calculations within density functional theory, we have investigated the electronic properties of H-passivated Si nanowires (SiNWs) oriented along the 112 direction, with the atomic geometries retrieved via global search using genetic algorithm. We show that [112] SiNWs have an indirect band gap in the ultrathin diameter regime, whereas the energy difference between the direct and indirect fundamental band gaps progressively decreases as the wire size increases, indicating that larger [112] SiNWs could have a quasi-direct band gap. We further show that this quasi-direct gap feature can be enhanced when applying uniaxial compressive stress along the wire axis. Moreover, our calculated results also reveal that the electronic band structure is sensitive to the change of the aspect ratio of the cross sections.
引用
收藏
页码:15680 / 15683
页数:4
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