HRTEM investigation of the epitaxial growth of scandate/titanate multilayers

被引：6

作者：

Boese, Markus ^{[1
]}

Heeg, Tassilo

Schubert, Juergen

Luysberg, Martina

机构：

[1] Inst Festkorperforsch, D-52425 Julich, Germany

[2] Ctr Mikroskopie & Spektroskopie Elecktronen, Forschungszentrum, D-52425 Julich, Germany

[3] Inst Schichten & Grenzflachen, Forschungszentrum, D-52425 Julich, Germany

来源：

JOURNAL OF MATERIALS SCIENCE | 2006年 / 41卷 / 14期

关键词：

D O I：

10.1007/s10853-006-0083-y

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Despite their potential application in strain-engineered layer structures, the epitaxial growth of rare earth scandate films on cubic perovskite substrates is not fully understood to date. Here we report on the epitaxy of the orthorhombic GdScO3 and DyScO3 on (001) BaTiO3 and SrTiO3 thin films. In particular, the orientation relationship between the orthorhombic epilayer and the cubic substrate is examined by aberration corrected high-resolution transmission electron microscopy. For all cases investigated, the long axis of the orthorhombic unit cell was found to be perpendicular to the growth direction.

引用

页码：4434 / 4439

页数：6

共 25 条

[1] Multiple relaxation mechanisms in SrTiO3/SrRuO3 heterostructures [J].

Ban, ZG ;

Alpay, SP ;

He, F ;

Wells, BO ;

Xi, XX .

APPLIED PHYSICS LETTERS, 2004, 84 (24) :4848-4850

[2]

BESCH W, 1990, SOLID STATE IONICS, V43, P171

[3] Room-temperature tunable microwave properties of strained SrTiO3 films [J].

Chang, W ;

Kirchoefer, SW ;

Pond, JM ;

Bellotti, JA ;

Qadri, SB ;

Haeni, JH ;

Schlom, DG .

JOURNAL OF APPLIED PHYSICS, 2004, 96 (11) :6629-6633

[4] Enhancement of ferroelectricity in strained BaTiO3 thin films [J].

Choi, KJ ;

Biegalski, M ;

Li, YL ;

Sharan, A ;

Schubert, J ;

Uecker, R ;

Reiche, P ;

Chen, YB ;

Pan, XQ ;

Gopalan, V ;

Chen, LQ ;

Schlom, DG ;

Eom, CB .

SCIENCE, 2004, 306 (5698) :1005-1009

[5] Maximum-likelihood method for focus-variation image reconstruction in high resolution transmission electron microscopy [J].

Coene, WMJ ;

Thust, A ;

deBeeck, M ;

VanDyck, D .

ULTRAMICROSCOPY, 1996, 64 (1-4) :109-135

[6] NEUTRON POWDER DIFFRACTION STUDIES OF SR2RUO4 AND SRRUO3 [J].

GARDNER, JS ;

BALAKRISHNAN, G ;

PAUL, DM .

PHYSICA C, 1995, 252 (3-4) :303-307

[7] Room-temperature ferroelectricity in strained SrTiO3 [J].

Haeni, JH ;

Irvin, P ;

Chang, W ;

Uecker, R ;

Reiche, P ;

Li, YL ;

Choudhury, S ;

Tian, W ;

Hawley, ME ;

Craigo, B ;

Tagantsev, AK ;

Pan, XQ ;

Streiffer, SK ;

Chen, LQ ;

Kirchoefer, SW ;

Levy, J ;

Schlom, DG .

NATURE, 2004, 430 (7001) :758-761

[8] Rare-earth scandate single- and multi-layer thin films as alternative gate oxides for microelectronic applications [J].

Heeg, T ;

Wagner, M ;

Schubert, J ;

Buchal, C ;

Boese, M ;

Luysberg, M ;

Cicerrella, E ;

Freeouf, JL .

MICROELECTRONIC ENGINEERING, 2005, 80 :150-153

[9] Microstructure of epitaxial SrRuO3 thin films on (001) SrTiO3 [J].

Jiang, JC ;

Pan, XQ ;

Chen, CL .

APPLIED PHYSICS LETTERS, 1998, 72 (08) :909-911

[10]

Kilaas R., 1987, P 45 ANN M EL MICR S, P66

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