Composition control of SBN thin films deposited by PLD on various substrates

被引:17
作者
Duclère, JR
Guilloux-Viry, M
Perrin, A
Clerc, C
Lalu, F
Lesueur, J
Zanetti, SM
Bouquet, V
Longo, E
机构
[1] Univ Rennes 1, Inst Chim Rennes, UMR CNRS 6511, Chim Solide & Inorgan Mol Lab, F-35042 Rennes, France
[2] Ctr Spectrometrie Nucl & Spectrometrie Masse, F-91405 Orsay, France
[3] UFSCar, LIEC, BR-13565905 Sao Carlos, SP, Brazil
来源
INTERNATIONAL JOURNAL OF INORGANIC MATERIALS | 2001年 / 3卷 / 08期
关键词
SrBi2Nb2O9; thin films; PLD; ferroelectrics; epitaxial growth;
D O I
10.1016/S1466-6049(01)00140-4
中图分类号
O61 [无机化学];
学科分类号
070301 ; 081704 ;
摘要
Thin films of SrBi2Nb2O9 (SBN) have been grown on both Pt/Ti/SiO2/Si and (100)MgO substrates by pulsed laser deposition. In the Sr-Bi-Nb-O system, the loss of bismuth during the process due to its volatility results obviously in a non-respect of the stoichiometry of the films and the presence of secondary phases. In order to maintain the right composition of the films, two different ways were experimented. On Pt/Ti/SiO2/Si, a sequential deposition from home-made Bi2O3 and SBN sintered targets as well as the use of Bi-enriched targets allows to obtain stoichiometric ferroelectric films. Various parameters like deposition time and periodicity of the Bi2O3 and SBN layers are of first importance. On ( 100)MgO which promotes SBN epitaxial growth, this sequential deposition is not suitable and we succeeded in the control of the Bi/(Sr+Nb) ratio only by using Bi-enriched targets. (C) 2001 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:1133 / 1135
页数:3
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