Stochastic modeling of nucleation and growth in a thin layer between two interfaces

被引:16
作者
Tagami, T
Tanaka, SI
机构
[1] Tanaka Solid Junction Project, ERATO, Res. Devmt. Corporation of Japan, Yokohama 236, 1-1-1, Fukuura, Kanazawa-ku
关键词
D O I
10.1016/S1359-6454(97)00021-9
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A stochastic modeling method is presented for the analysis of nucleation and growth in a thin layer between two interfaces. In this layer, nucleation occurs randomly and growth slops at the interfaces after instantaneous growth. This halting of the growth causes non-random impingement because phantom crystallites in the Kolmogorov-Johnson-Mehl-Avrami (KJMA) model shrink to an effective size. This stochastic model successfully deals with effective size using a factor gamma which accounts for the overlap between a phantom crystallite and a crystallite. This leads to a phenomenological equation for nonrandom impingement: dX(t)/dV(ex) = [1 - X(t)](i), where X(t) is the transformed fraction and V-ex is the KJMA extended volume fraction. It is shown that the exponent is clearly expressed as i = 2 - gamma. An analytical solution of the transformed fraction agrees very well with the numerical simulations. (C) 1997 Acta Metallurgica Inc.
引用
收藏
页码:3341 / 3347
页数:7
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