Direct observation of electron jet from a point contact

被引：6

作者：

Nagamune, Y ^{[1
]}

Noda, T ^{[1
]}

Watabe, H ^{[1
]}

Ohno, Y ^{[1
]}

Sakaki, H ^{[1
]}

Arakawa, Y ^{[1
]}

机构：

[1] UNIV TOKYO, ADV SCI & TECHNOL RES CTR, MEGURO KU, TOKYO 153, JAPAN

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 1996年 / 35卷 / 2B期

关键词：

point contact; photoluminescence; transport; visualization; quantum well;

D O I：

10.1143/JJAP.35.1151

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We report on the photoluminescence image around a point contact fabricated in an InGaAs/GaAs quantum well using a micro-photoluminescence measurement technique. The photoluminescence image was strongly influenced by majority electron flow from the point contact, where the majority electron flow greately reduced radiative recombination of electron-hole pairs generated by the laser illumination. Using this effect we demonstrated visualization of electron flow from the point contact.

引用

页码：1151 / 1153

页数：3