Measurement of temperature rises in the femtosecond laser pulsed three-dimensional atom probe

被引：87

作者：

Cerezo, A

Smith, GDW

Clifton, PH

机构：

[1] Univ Oxford, Dept Mat, Oxford OX1 3PH, England

[2] Oxford Nanosci, Milton Keynes MK11 3ER, Bucks, England

来源：

APPLIED PHYSICS LETTERS | 2006年 / 88卷 / 15期

关键词：

D O I：

10.1063/1.2191412

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A previous Letter [B. Gault , Appl. Phys. Lett. 86, 094101 (2005)] interpreted measurements of the field evaporation enhancement under femtosecond pulsed laser irradiation of a field emitter in terms of a direct electric field enhancement by the intrinsic field of the laser light. We show that, on the contrary, the field evaporation enhancement is predominantly a thermal heating effect. Indirect measurements of the peak specimen temperature under irradiation by femtosecond laser pulses are consistent with temperature rises obtained using longer laser pulses in a range of earlier work. (c) 2006 American Institute of Physics.

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页数：3

相关论文

共 10 条

[1] APPLICATION OF A POSITION-SENSITIVE DETECTOR TO ATOM PROBE MICROANALYSIS [J].

CEREZO, A ;

GODFREY, TJ ;

SMITH, GDW .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1988, 59 (06) :862-866

[2] PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS [J].

CEREZO, A ;

GROVENOR, CRM ;

SMITH, GDW .

JOURNAL OF MICROSCOPY-OXFORD, 1986, 141 :155-170

[3] Estimation of the tip field enhancement on a field emitter under laser illumination [J].

Gault, B ;

Vurpillot, F ;

Bostel, A ;

Menand, A ;

Deconihout, B .

APPLIED PHYSICS LETTERS, 2005, 86 (09) :1-3

[4] DETERMINING THE FIELD EMITTER TEMPERATURE DURING LASER IRRADIATION IN THE PULSED LASER ATOM PROBE [J].

KELLOGG, GL .

JOURNAL OF APPLIED PHYSICS, 1981, 52 (08) :5320-5328

[5] PULSED-LASER ATOM-PROBE FIELD-ION MICROSCOPY [J].

KELLOGG, GL ;

TSONG, TT .

JOURNAL OF APPLIED PHYSICS, 1980, 51 (02) :1184-1193

[6] Information storage materials: nanoscale characterisation by three-dimensional atom probe analysis [J].

Larson, DJ ;

Petford-Long, AK ;

Ma, YQ ;

Cerezo, A .

ACTA MATERIALIA, 2004, 52 (10) :2847-2862

[7] APPLICATION OF POSITION-SENSITIVE ATOM PROBE TO THE STUDY OF THE MICROCHEMISTRY AND MORPHOLOGY OF QUANTUM WELL INTERFACES [J].

LIDDLE, JA ;

NORMAN, AG ;

CEREZO, A ;

GROVENOR, CRM .

APPLIED PHYSICS LETTERS, 1989, 54 (16) :1555-1557

[8]

Miller M. K., 2000, ATOM PROBE TOMOGRAPH

[9]

Miller M. K., 1996, ATOM PROBE FIELD ION

[10] EFFECT OF OPTICAL DIFFRACTION ON LASER-HEATING OF A FIELD EMITTER [J].

ROBINS, ES ;

LEE, MJG ;

LANGLOIS, P .

CANADIAN JOURNAL OF PHYSICS, 1986, 64 (01) :111-117